Accession Number:

AD0760335

Title:

Structure, Properties and Radiation Sensitivity of Electrically Bistable Materials

Descriptive Note:

Annual technical rept. 5 Feb 1972-6 Feb 1973

Corporate Author:

FLORIDA UNIV GAINESVILLE ENGINEERING AND INDUSTRIAL EXPERIMENT STATION

Personal Author(s):

• Dove, Derek B.
• Loehman, Ronald E.

Report Date:

1973-02-06

Pagination or Media Count:

30.0

Abstract:

The report contains a review of work carried out on the electrical properties of contacts to chalcogenide glasses. The room temperature electrical properties of thin films of glasses have been measured with both sandwich and planar electrode configurations. Conductance and capacitance were measured versus frequency in the two cases as a function of bias voltage. A variation in response was found with bias voltage except in the case of the planar structure with molybdenum electrodes. The variation is quite consistent with a model in which Schottky barriers exist at the electrodes. Measurements of the spectral distribution of noise currents have also been made for the two film configurations under bias and no bias conditions. All devices showed an increase in noise by several orders of magnitude when a biasing voltage was applied.

Descriptors:

• *SEMICONDUCTING FILMS
• ARSENIDES
• CAPACITANCE
• ELECTRICAL CONDUCTIVITY
• ELECTRICAL PROPERTIES
• ELECTRODES
• GERMANIUM COMPOUNDS
• TELLURIDES

Subject Categories:

• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE