Accession Number:

AD0758197

Title:

Physical Characterization of Electronic Materials, Devices and Thin Films

Descriptive Note:

Final rept. 1 Dec 1969-30 Nov 1972

Corporate Author:

MANLABS INC CAMBRIDGE MA

Personal Author(s):

Report Date:

1972-12-01

Pagination or Media Count:

27.0

Abstract:

The research is directed toward the characterization of specified physical, chemical and structural properties of various materials. Experimental methods include chemical analysis, electron microscopy and reflection diffraction, X-ray diffraction and fluorescence analysis, light microscopy and electron microprobe analysis, in addition to the determination of specific properties, such as density, hardness and thermal conductivity. Special services, such as crystal orientation, cutting, grinding and polishing are also being performed. Specific materials submitted for characterization include lithium germanate, silicon, silicon carbide, quartz, ruby, gallium arsenide, boron, lithium niobate, lithium tantalate, lithium fluoride, potassium chloride, sodium chloride, potassium bromide, gallium phosphide, indium phosphide, calcium fluoride, zinc telluride, bismuth germanium oxide and aluminum nitride. In addition, a variety of specimens have been submitted for specific studies such as phase identification, crystallinity and chemical analysis.

Subject Categories:

  • Crystallography
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE