Accession Number:

AD0754878

Title:

Ellipsometric Study of Polished Glass Surfaces,

Descriptive Note:

Corporate Author:

TOKAI UNIV HIRATSUKA (JAPAN) DEPT OF ELECTRO-PHOTO-OPTICS ENGINEERI

Report Date:

1969-01-01

Pagination or Media Count:

10.0

Abstract:

The refractive index nf and thickness df of the polish layer on the surface of various kinds of glass polished under standard conditions were determined by ellipsometry. The method of ellipsometry employed was based on the measurement of the principal angle of incidence and the ellipticity of the light reflected at this angle. Author

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE