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Ellipsometric Study of Polished Glass Surfaces,
TOKAI UNIV HIRATSUKA (JAPAN) DEPT OF ELECTRO-PHOTO-OPTICS ENGINEERI
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The refractive index nf and thickness df of the polish layer on the surface of various kinds of glass polished under standard conditions were determined by ellipsometry. The method of ellipsometry employed was based on the measurement of the principal angle of incidence and the ellipticity of the light reflected at this angle. Author
APPROVED FOR PUBLIC RELEASE