Fault Detection and Diagnosis in Combinational Circuits.
Research and development technical rept.,
OHIO UNIV ATHENS DEPT OF ELECTRICAL ENGINEERING
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Two approaches to detection and diagnosis of single-gate failures are presented. One is an algebraic approach which derives minimal test sets by iterative intersections of higher dimensional cubes representing tests and the other is a tabular method that requires use of diagnostic tables. A diagnostic table lists gate sensitivities and network primary output values, with and without the failures present, for all possible inputs to the network. This information is used to locate a faulty gate and describe its failed function. Techniques for deriving minimal test sets and adaptive test schedules from diagnostic tables are also derived. The application of diagnostic tables to the deprivation of equivalence classes of faults in combinational networks is presented. A synthesis technique using diagnostic tables is also derived. The problem of diagnosable synthesis of combinational nets is considered. Author
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