Accession Number:

AD0752540

Title:

Pulsed-Power Burnout of Integrated Circuits

Descriptive Note:

Rept. for Sep 1971-Mar 1972

Corporate Author:

AEROSPACE CORP EL SEGUNDO CA LAB OPERATIONS

Personal Author(s):

• Vandre, R. H.

Report Date:

1972-08-15

Pagination or Media Count:

43.0

Abstract:

Results of pulsed-power burnout testing the Fairchild 9046 quad dual-input nand gate and the Amelco 6041 three-input nand gate showed the circuits to be vulnerable to junction burnout for pulses of less than 100 V and pulse widths on the order of 100 nsec. Calculations based on Wunsch-Bell junction burnout theory showed good agreement with the experimental results. Sample calculations applying Wunsch-Bell theory to integrated circuits are given.

Descriptors:

• *INTEGRATED CIRCUITS
• NUCLEAR EXPLOSIONS
• DAMAGE
• SILICON
• RELIABILITY(ELECTRONICS)
• FAILURE(ELECTRONICS)
• ELECTROMAGNETIC PULSES
• SPACECRAFT COMPONENTS
• AIRBURST
• GATES(CIRCUITS)

Subject Categories:

• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE