Pulsed-Power Burnout of Integrated Circuits
Rept. for Sep 1971-Mar 1972
AEROSPACE CORP EL SEGUNDO CA LAB OPERATIONS
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Results of pulsed-power burnout testing the Fairchild 9046 quad dual-input nand gate and the Amelco 6041 three-input nand gate showed the circuits to be vulnerable to junction burnout for pulses of less than 100 V and pulse widths on the order of 100 nsec. Calculations based on Wunsch-Bell junction burnout theory showed good agreement with the experimental results. Sample calculations applying Wunsch-Bell theory to integrated circuits are given.
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