Accession Number:

AD0749083

Title:

Characterization of IR Windows

Descriptive Note:

Quarterly technical rept. no. 3

Corporate Author:

LITTLE (ARTHUR D) INC CAMBRIDGE MA

Personal Author(s):

Report Date:

1972-09-01

Pagination or Media Count:

19.0

Abstract:

The report includes studies on transmission electron microscopy of several of the initially received samples of GaAs crystals as well as back reflection X-ray topography of two additional lots of samples received from Bell Howell. Transmission electron microscopy revealed evidence for the presence of very fine 100A defects having a density of 1 to 5 x 10 to the 17th powercc. Preliminary calculations based on assumed metallic or dielectric properties indicate that the observed optical absorptivities at 10.6 microns could be caused by these defects.

Subject Categories:

  • Lasers and Masers
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE