Electrical Characterization of Complex Microcircuits
Final technical rept. Mar 1971-Mar 1972
GENERAL ELECTRIC CO PITTSFIELD MA ORDNANCE SYSTEMS DEPT
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Section 3000 of MIL-STD-883 was reviewed and rewritten. New or modified slash sheets to MIL-M-38510 were prepared for DTL and T2L-SSI logic circuits. 741 Operational Amplifier, 710711LM106 Differential Comparator, and the 723 Regulator. The results of the vendor comparison, test circuits, and proposed slash sheets are included. Test profiles were prepared for a broad range of bipolar and MOS semiconductor memories. ROMs PROMs, and static and dynamic RAMs were considered. The test profiles cover static and dynamic functional test requirements. MSILSI test considerations were based upon the development of a minimum set of logic tests, based upon a stuck-at-one, stuck-at-zero philosophy in order to provide a rapid and accurate functional test of complex devices. This testing criteria termed Logic Integrity Tests is described and is proposed for inclusion in MIL-STD-883. Test Vectors based upon the Logic Integrity Test for the 2 and 4 bit full adders, 4 x 2 multiplier and the 934154181 Arithmetic Logic Unit are included in this report.
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