Conduction Mechanisms in Thick Film Microcircuits
Semi-annual technical rept. 1 Jan-30 Jun 1972
PURDUE RESEARCH FOUNDATION LAFAYETTE IN
Pagination or Media Count:
Preliminary results on resistor microstructure are presented and their correlation with the proposed model discussed. The study of RuO2-glass composites led to the conclusion that the difference in thermal expansion between the RuO2 and the glass is a minor factor in controlling resistor TCR. Preliminary studies of the resistance changes during firing of a thick film resistor are described. Evaluation of the performance of the screen printing machine has established that the variations in resistor value which can be expected from this phase of the process will be less than plus or minus 5.
- Electrical and Electronic Equipment