Semiconductor and Nonsemiconductor Damage Study
Final rept. (Volume 1)
BRADDOCK DUNN AND MCDONALD INC EL PASO TX
Pagination or Media Count:
Contents Determination of threshold failure levels of semiconductor diodes and transistors due to pulse voltages Estimates of semiconductor failure due to multiple voltage pulses Semiconductor damage test results Nonsemiconductor damage test results.
- Electrical and Electronic Equipment