Accession Number:

AD0745926

Title:

Semiconductor and Nonsemiconductor Damage Study

Descriptive Note:

Final rept. (Volume 1)

Corporate Author:

BRADDOCK DUNN AND MCDONALD INC EL PASO TX

Personal Author(s):

Report Date:

1969-04-01

Pagination or Media Count:

228.0

Abstract:

Contents Determination of threshold failure levels of semiconductor diodes and transistors due to pulse voltages Estimates of semiconductor failure due to multiple voltage pulses Semiconductor damage test results Nonsemiconductor damage test results.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE