Accession Number:

AD0744076

Title:

X-Ray Topographic Observations of Slip Distributions in Alpha Silicon Carbide.

Descriptive Note:

Physical sciences research papers,

Corporate Author:

AIR FORCE CAMBRIDGE RESEARCH LABS L G HANSCOM FIELD MASS

Personal Author(s):

• Posen,Harold
• Bruce,Jane A.

Report Date:

1972-03-30

Pagination or Media Count:

21.0

Abstract:

An x-ray topographic study is made of three hexagonal SiC crystals, type 6H, of different national origin. All three crystals exhibit a high density of dislocations, many originating at the nucleation edge of the crystal and fanning out to the crystal boundaries. Burgers vectors were identified. Slip in the 1,1,-2,0 direction, characteristic of hexagonal materials, was observed. Author

Descriptors:

• (*SILICON CARBIDES
• X RAY DIFFRACTION)
• SINGLE CRYSTALS
• DISLOCATIONS
• DEFECTS(MATERIALS)

Subject Categories:

• Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE