Accession Number:

AD0743459

Title:

Applications of Dual Parameter Analyzers in Solid-State Laser Tests.

Descriptive Note:

Research and development technical rept.,

Corporate Author:

ARMY ELECTRONICS COMMAND WHITE SANDS MISSILE RANGE N MEX ATMOSPHERIC SCIENCES LAB

Report Date:

1972-04-01

Pagination or Media Count:

24.0

Abstract:

New applications of a 128 by 128 channel, computer-controlled, dual parameter analyzer used to record, compute, and display solid-state laser emission and propagation data are described. The pulse-height-analysis coincidence mode is used to make spike amplitude measurements on reference and propagated signals or make spike coincidence measurements on two spectrometer output signals. An X-Y contour mode display provides a real-time visual indication of results for wavelength-dependent absorption tests, cavity mode tests, and beam cross-section studies. A description of an operating system and initial test results are presented. Author

Subject Categories:

  • Lasers and Masers
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE