Accession Number:

AD0742847

Title:

Reliability Prediction for Monolithic Integrated Circuits

Descriptive Note:

Final rept.

Corporate Author:

ARINC RESEARCH CORP ANNAPOLIS MD

Personal Author(s):

Report Date:

1971-11-01

Pagination or Media Count:

32.0

Abstract:

The report presents the results of a study directed toward developing a reliability-prediction technique for monolithic integrated circuits. A prediction model that expresses reliability as a function of device screening, sampling, system burn-in test, and field operate time was developed. The equation is based on data taken from military, space, and commercial application of integrated circuits. The report presents the rationale that led to formation of the equation and describes its use and methods of application.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE