Reliability Prediction for Monolithic Integrated Circuits
ARINC RESEARCH CORP ANNAPOLIS MD
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The report presents the results of a study directed toward developing a reliability-prediction technique for monolithic integrated circuits. A prediction model that expresses reliability as a function of device screening, sampling, system burn-in test, and field operate time was developed. The equation is based on data taken from military, space, and commercial application of integrated circuits. The report presents the rationale that led to formation of the equation and describes its use and methods of application.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems