Quantitative Measurement of the Properties of Defects in Metals.
Final rept. 22 Sep 64-30 Sep 71,
ILLINOIS INST OF TECH CHICAGO DEPT OF PHYSICS
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In the study of defect interactions in solids the field ion microscope has become an important tool. Until now, the interpretation of field ion microscope patterns has been done primarily on the geometric relationship of the spots. A technique and an equation by which additional information can be obtained from field ion patterns, specifically with regard to the quantity of the electric field at an imaging spot, is now available as a result of the present research. By calculation of the electric field at a selected spot, quantitative field ion information can be directly employed in the study of strengthening mechanisms of materials. For example, the identity of the interstitial bright spot can be deduced if the value of the electric field is known when the spot field evaporates. Author
- Metallurgy and Metallography