Accession Number:

AD0742237

Title:

Operation and Maintenance Manual, Microelectronic Wafer and Integrated Circuit Test Set, TTU-311/E (XV-1).

Descriptive Note:

Technical rept. 28 May 70-31 Aug 71.

Corporate Author:

RESEARCH TRIANGLE INST DURHAM N C

Personal Author(s):

Report Date:

1972-01-01

Pagination or Media Count:

47.0

Abstract:

Procedures are given for operation and maintenance of Test Set TTU-311E. The Test Set is used as an operator aid in the visual inspection of integrated ciruits on the production line. A functional description is first given, followed by operational procedures. System maintenance procedures are then described. Author

Descriptors:

• (*INTEGRATED CIRCUITS
• *TEST SETS)
• QUALITY CONTROL
• INSTRUCTION MANUALS
• VISUAL INSPECTION
• DAMAGE
• RADIATION EFFECTS
• MAINTENANCE

Subject Categories:

• Electrical and Electronic Equipment
• Manufacturing and Industrial Engineering and Control of Production Systems
• Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE