Accession Number:

AD0739709

Title:

Deformation of Field Ion Microscopy Tips by Mechanical Contact.

Descriptive Note:

Technical memo.,

Corporate Author:

PENNSYLVANIA STATE UNIV UNIVERSITY PARK ORDNANCE RESEARCH LAB

Personal Author(s):

Report Date:

1971-01-15

Pagination or Media Count:

63.0

Abstract:

Tungsten and iridium field ion microscope FIM tips served as asperities which were subjected to measurable compressive loads by mechanically contacting them in air to tungsten and platinum plates. FIM tips contacted with tungsten displayed dented regions of irregular shape, where FIM tips contacted to platinum had well designed, nearly circular contact regions. Average contact pressures were calculated. Mechanically induced twinning on the 111 planes of 001 oriented iridium tips was observed to occur for iridium-tungsten and iridium-platinum contacts. This can be explained by an imperfect slip of each layer of the 111 plane into a 112 direction. The critical shear stress necessary for twinning was also estimated. Author

Subject Categories:

  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE