Accession Number:

AD0739219

Title:

Plotting Isothermal Diagrams by an X-Ray Diffraction Method,

Descriptive Note:

Corporate Author:

FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

Report Date:

1971-12-11

Pagination or Media Count:

16.0

Abstract:

A vacuum device for high temperature X-ray diffraction analysis is described heating by A.C., sample heating velocity 100 degrees-sec., sample cooling rate 20 degrees-sec within 600-700 degrees, temperature changes of several degrees during the measurement, given residual pressure at 1000 degrees achieved within 1-1.5 hr., angular velocity one fourth-30 degrees-min., CsJTl crystal of a thickness of 0.8 mm, input 4kVA. Device parameters enable the plotting of isothermal diagrams of low alloyed Ti alloys. Isothermal diagrams of Ti4Al6Cr alloy and diagrams of isothermal decomposition of the metastable beta phase in Ti12V3Al, Ti6V4Al, Ti10V4Al, and Ti12V3Al alloys are given. Author

Subject Categories:

  • Properties of Metals and Alloys
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE