Accession Number:

AD0738907

Title:

High-G Testing of Electronic Components.

Descriptive Note:

Master's thesis,

Corporate Author:

NAVAL POSTGRADUATE SCHOOL MONTEREY CALIF

Personal Author(s):

Report Date:

1971-06-01

Pagination or Media Count:

75.0

Abstract:

High-g acceleration produced by large bore guns is compared with impact acceleration. Methods for subjecting electronic components and circuit packages to high-g launch environments up to 550,000-g are outlined and analyzed. An analysis of the effect of the high-g environment on components is performed on a component by component basis. Methods for selecting, hardening and testing components for high-g circuitry are given as are circuit construction and assembly details. An extensive appendix listing type, manufacturer and part number is included for components that have survived high-g environmental testing. Recommendations are made for an improved test program that will yield a new generation of reliable high-g hardened components for circuit design. Author

Subject Categories:

  • Manufacturing and Industrial Engineering and Control of Production Systems
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE