High-G Testing of Electronic Components.
NAVAL POSTGRADUATE SCHOOL MONTEREY CALIF
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High-g acceleration produced by large bore guns is compared with impact acceleration. Methods for subjecting electronic components and circuit packages to high-g launch environments up to 550,000-g are outlined and analyzed. An analysis of the effect of the high-g environment on components is performed on a component by component basis. Methods for selecting, hardening and testing components for high-g circuitry are given as are circuit construction and assembly details. An extensive appendix listing type, manufacturer and part number is included for components that have survived high-g environmental testing. Recommendations are made for an improved test program that will yield a new generation of reliable high-g hardened components for circuit design. Author
- Manufacturing and Industrial Engineering and Control of Production Systems
- Test Facilities, Equipment and Methods