Accession Number:

AD0738535

Title:

The Enhancement of Electronics Reliability through the Use of Transconductance Efficiency.

Descriptive Note:

Technical memo.,

Corporate Author:

ARMY MATERIEL SYSTEMS ANALYSIS AGENCY ABERDEEN PROVING GROUND MD

Personal Author(s):

Report Date:

1972-01-01

Pagination or Media Count:

50.0

Abstract:

Solid-state active devices are basically transconductance controlled their characteristics can be expressed by the Fermi parameter and a transconductance efficiency factor. The report develops the theoretical basis for the efficiency factor. The report also indicates how the efficiency factor may be used to evaluate the operating conditons for active devices, select the best ones for particular purposes, and increase the reliability of their circuits. Comparative design calculations are given in examples to show how electrical stability and resistance to radiation damage and destructive thermal environments can be enhanced by using otherwise unobservable parameters, the properties of which are disclosed in the analytical discussion. Author

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE