Accession Number:

AD0738474

Title:

Dielectric Relaxation in Crystalline V2O5.

Descriptive Note:

Technical rept.,

Corporate Author:

OREGON STATE UNIV CORVALLIS DEPT OF CHEMISTRY

Personal Author(s):

Report Date:

1972-02-29

Pagination or Media Count:

16.0

Abstract:

The real part of the dielectric constant in crystalline V2O5 has been measured in the temperature range 80K to 200K. It rises from about 5, at low temperature, to about 9 in a narrow temperature range which depends upon frequency. The ac conductivity exceeds the dc conductivity by a measurable amount at low temperature, because of the contribution of relaxation. The crystal behaves approximately as a Debye dielectric. The relaxation time was found as a function of temperature. Two models for dipolar centers are proposed and discussed. Author

Subject Categories:

  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE