An Advanced Method of Measurement of Spot-Sizes of Very-High-Resolution Cathode-Ray Tubes.
Research and development technical rept.,
ARMY ELECTRONICS COMMAND FORT MONMOUTH N J
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Several methods of measurement of spot-size of a very-high-resolution cathode-ray tube CRT are described, and their shortcomings or inconveniences are pointed out. An advanced method is described, combining the best features of the previous methods and circumventing their disadvantages. The method consists of dissection of the spot in two orthogonal dimensions by projection of a magnified circular trace scanned on the CRT phosphor upon two orthogonal pairs of parallel slits and reading the time-progression of the light-flux transmitted. The output is displayed upon an oscilloscope, and the separation of peaks in each pair is correlated with calibrated slit-separation. Optical and electronic apparatus for accomplishing the measurements is described. Examples of oscilloscope traces are shown, and their characteristics are interpreted. Author
- Electrooptical and Optoelectronic Devices