Accession Number:

AD0733206

Title:

Method of Checking Thickness of Thin Films during Vacuum-Spraying Process,

Descriptive Note:

Corporate Author:

FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

Report Date:

1971-08-20

Pagination or Media Count:

6.0

Abstract:

Thin film thickness can be checked during a vacuum-spraying process by a spectrum analyzer which scans the light passing through the film continuously. A photoelectric receiver sends a signal to the amplifier of the vertical deflection of an oscillograph. The horizontal sweep is controlled by a signal which is proportional to the light wave length. The shape of the graph on the screen is compared with a nominal graph within a spectrum region spanning at least half an octave on the wave length scale. When both graphs have the greatest similarity in shape, the spraying process is stopped. Author

Subject Categories:

  • Manufacturing and Industrial Engineering and Control of Production Systems
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE