Accession Number:
AD0733188
Title:
Effects of Proton Radiation on Capacitance/Voltage Characteristics of M.O.S. Capacitors,
Descriptive Note:
Corporate Author:
MANITOBA UNIV WINNIPEG DEPT OF ELECTRICAL ENGINEERING
Personal Author(s):
Report Date:
1971-04-20
Pagination or Media Count:
2.0
Abstract:
The capacitancebias-voltage characteristics of metal-oxide-semiconductor capacitors were measured before and after irradiation with 25 MeV protons under various bombardment voltages applied to the gate during irradiation. The radiation-induced charge carriers are trapped in a localized region that extends approximately 300 A into the oxide layer from the Si-SiO2 interface. The induced space-charge density shows an exponential dependence on the radiation dose and a linear dependence on the bombardment voltage. The effects are independent of the dose rate and appear to approach saturation for a dose of 3.5 x 10 to the 13th power protonssq cm with an effective bombardment voltage of 5 V. Author
Descriptors:
Subject Categories:
- Electrical and Electronic Equipment
- Radioactivity, Radioactive Wastes and Fission Products