Accession Number:

AD0733188

Title:

Effects of Proton Radiation on Capacitance/Voltage Characteristics of M.O.S. Capacitors,

Descriptive Note:

Corporate Author:

MANITOBA UNIV WINNIPEG DEPT OF ELECTRICAL ENGINEERING

Personal Author(s):

Report Date:

1971-04-20

Pagination or Media Count:

2.0

Abstract:

The capacitancebias-voltage characteristics of metal-oxide-semiconductor capacitors were measured before and after irradiation with 25 MeV protons under various bombardment voltages applied to the gate during irradiation. The radiation-induced charge carriers are trapped in a localized region that extends approximately 300 A into the oxide layer from the Si-SiO2 interface. The induced space-charge density shows an exponential dependence on the radiation dose and a linear dependence on the bombardment voltage. The effects are independent of the dose rate and appear to approach saturation for a dose of 3.5 x 10 to the 13th power protonssq cm with an effective bombardment voltage of 5 V. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Radioactivity, Radioactive Wastes and Fission Products

Distribution Statement:

APPROVED FOR PUBLIC RELEASE