Accession Number:

AD0731818

Title:

Microcircuit Environmental Data Tabulations,

Descriptive Note:

Corporate Author:

IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER

Personal Author(s):

Report Date:

1971-08-01

Pagination or Media Count:

126.0

Abstract:

This is a new data product of the Reliability Analysis Center that will be updated and reprinted periodically as additional data are accumulated. It provides quantitative information on the susceptibility of microcircuit devices to the influence of physical, mechanical, and atmospheric environments. Also included are attributes data from normal lot inspection and equipment checkout procedures. The listing is categorized according to physical device properties and applied stress conditions. It reports percent defective statistics and observed failure modes at each condition. This compendium is especially useful for determining predominant failure modes of candidate designs under contemplated use environments, expected quality inspection fallout levels, and the most effective screens for removing marginal devices. Author

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE