Reliability Physics Study of Microwave Solid State Devices.
Final rept. 25 Mar 70-24 Mar 71,
TEXAS INSTRUMENTS INC DALLAS CENTRAL RESEARCH LABS
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The report covers the second half of a year-long study of the reliability physics of Gunn, LSA, and IMPATT devices. The major topics of discussion are thermal transport, failure mechanisms, and the results of life tests on Gunn, LSA, and IMPATT devices. Finally, an attempt is made to draw conclusions from these studies and to establish some acceptance criteria which should insure reliable performance of the bulk microwave devices. Author
- Electrical and Electronic Equipment