Bulk Semiconductor Limiters.
Final rept. 1 May 70-30 Apr 71,
RENSSELAER RESEARCH CORP TROY N Y ELECTRONIC SYSTEMS DEPT
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Theoretical and experimental efforts have been continued toward the realization of bulk semiconductor limiter components. Significant progress has been achieved in the areas of thermal analysis, isolation characteristics, recovery characteristics, noise evaluation, encapsulation and cascade operation. A theoretical analysis has been developed which yields the temperature profile of the limiter structure as a function of space and time. Refinements in fabricating checkerboard contact limiter elements, which were invented during the previous contract period, were made which produced superior limiting characteristics, lower spike leakage, and faster device recovery. Microwave recovery period noise was measured on phosphorus diffused silicon limiter elements. Both a double slit gas encapsulated Ku-band limiter component and a single slit X-band plastic encapsulated unit were fabricated and tested successfully to 10 kilowatts without external pressurization. Cascade bulk semiconductor limiter structures were tested at X-band with input transmitted powers from 5 watts to 10 kilowatts. Author
- Electrical and Electronic Equipment