Accession Number:

AD0728458

Title:

Goodness of Fit Tests for the Gamma and Exponential Distributions.

Descriptive Note:

Technical summary rept.,

Corporate Author:

WISCONSIN UNIV MADISON MATHEMATICS RESEARCH CENTER

Personal Author(s):

• Dahiya,Ram C.
• Gurland,John

Report Date:

1971-06-01

Pagination or Media Count:

32.0

Abstract:

Goodness of fit tests based on generalized minimum Chi square are developed for the gamma and exponential distributions. The power of these tests has been found for several alternative families of distributions by utilizing the asymptotic non-null distribution of the test statistics. The tests behave very well for the types of alternatives considered here. Applications to some failure data of Proschan 1963 are included for illustrative purposes. Author

Descriptors:

• *STATISTICAL TESTS
• POWER
• STATISTICAL DISTRIBUTIONS
• EXPONENTIAL FUNCTIONS
• RELIABILITY
• LIFE EXPECTANCY(SERVICE LIFE)
• SAMPLING
• THEOREMS

Subject Categories:

• Statistics and Probability

Distribution Statement:

APPROVED FOR PUBLIC RELEASE