Bulk Semiconduction Limiters.
Quarterly progress rept. no. 3, 1 Nov 70-31 Jan 71,
RENSSELAER RESEARCH CORP TROY N Y ELECTRONIC SYSTEMS DEPT
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The effort stresses the realization of performance goals for solid state microwave limiters as well as the measurement of their noise emission characteristics. The successful fabrication and testing of checkerboard limiters was achieved. Duplexer recovery time measurements showed that these limiters exceed the performance recovery time goal of 2 microseconds to 3 dB loss after a 5 kilowatt pulse. Gated noise measurements and system sensitivity measurements were made on slow recovery phosphorus diffused limiters. The results of these measurements indicate that performance is degraded by less than 1 dB by recovery period noise. Other discussions presented include improvements in fabrication and high power performance. Results of cascaded limiter tests are also included in the report. Author
- Electrical and Electronic Equipment