Conference Proceedings: Component Degradation from Transient Inputs, 28-29 April 1970.
ARMY MOBILITY EQUIPMENT RESEARCH AND DEVELOPMENT CENTER FORT BELVOIR VA
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The proceedings of the conference on Component Degradation From Transient Inputs is presented. The papers given cover the effects of induced electrical transients, as produced by an Electromagnetic Pulse on electronic components. Attention focused on electrical stress degradation and damage on semiconductors. Topics such as thermal damage models, Multiple damage mechanisms, effects of complex waveshapes, synergistic effects, effects on integrated circuitry, and the statistics involved in the characterization of failure are discussed. Author
- Electrical and Electronic Equipment