Accession Number:

AD0725070

Title:

Physical Characterization of Electronic Materials, Devices and Thin Films,

Descriptive Note:

Corporate Author:

MANLABS INC CAMBRIDGE MASS

Personal Author(s):

Report Date:

1971-01-01

Pagination or Media Count:

46.0

Abstract:

In support of research being conducted by the Properties and Phenomena Branch, Solid State Science Laboratory, Air Force Cambridge Research Laboratory, ManLabs, Inc. is conducting a service effort that is directed toward the characterization of specified physical, chemical and structural properties of various materials. Experimental methods include chemical analysis, reflection electron microscopy and diffraction, X-ray diffraction and fluorescence analysis, light microscopy and electron microprobe analysis, in addition to the determination of specific properties, such as density, hardness and thermal conductivity. Special services, such as crystal orientation, cutting, grinding and polishing are also being performed. Specific materials submitted for characterization include spinel, lithium germanate, silicon, silicon carbide, quartz, ruby, magnesium oxide, copper chloride, gallium arsenide, boron, potassium tantalum niobate, yttrium-iron garnet, yttrium-aluminum garnet and lithium niobate. In addition, a variety of specimens have been submitted for specific studies such as phase identification, crystallinity and chemical analysis. Author

Subject Categories:

  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE