Accession Number:

AD0724106

Title:

Computer Programs to Evaluate Semiconductor Materials in Conjunction with Schottky Barriers.

Descriptive Note:

Research and development technical rept.,

Corporate Author:

ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Personal Author(s):

Report Date:

1971-03-01

Pagination or Media Count:

32.0

Abstract:

The report presents two computer programs written in FORTRAN COMPUTER LANGUAGE FOR USE ON REMOTE ACCESS TELETYPE TERMINALS WHICH CAN BE USED TO CALCULATE THE IMPURITY DOPING PROFILES OF SEMICONDUCTOR MATERIALS. These programs are used in conjunction with capacitance-voltage measurements on rectifying Schottky barrier contacts. The basic mathematical equation used in the calculations are derived and the program logic is discussed. One program uses curve fitting techniques to obtain a polynomial which produces a best-fit curve to the data by employing a least squares criterion. The second program is based on differential capacitance voltage measurements to make point-by-point calculations of carrier concentration and depth. The advantages and disadvantages of each technique are discussed. Author

Subject Categories:

  • Computer Programming and Software
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE