Accession Number:

AD0723671

Title:

Methods of Measurement for Semiconductor Materials, Process Control, and Devices.

Descriptive Note:

Quarterly rept. 1 Jul-30 Sep 70,

Corporate Author:

NATIONAL BUREAU OF STANDARDS WASHINGTON DC ELECTRONIC TECHNOLOGY DIV

Personal Author(s):

Report Date:

1971-04-01

Pagination or Media Count:

64.0

Abstract:

The quarterly progress report, ninth of a series, describes NBS activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices. Work is continuing on measurement of resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor crystals specification of germanium for gamma-ray detectors evaluation of wire bonds, metallization adhesion, and die attachment measurement of thermal properties of semiconductor devices and characterization of silicon nuclear radiation detectors. New effort is being started on the measurement of transit-time and related carrier transport properties in junction devices. Supplementary data concerning staff, standards committee activities, technical services, and publications are included as appendixes. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Fabrication Metallurgy
  • Test Facilities, Equipment and Methods
  • Nuclear Instrumentation
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE