Accession Number:

AD0723442

Title:

Fault Diagnosis in FET Modules,

Descriptive Note:

Corporate Author:

ILLINOIS UNIV URBANA COORDINATED SCIENCE LAB

Personal Author(s):

Report Date:

1971-05-01

Pagination or Media Count:

14.0

Abstract:

The use of Field Effect Transistor FET devices in logic design has changed the design emphasis from networks composed of single logic gates to networks composed of complex functional modules. Fault diagnosis techniques which have been discussed in the literature are based on the former type networks and hence are somewhat inadequate for this new technology. This paper presents an approach to the generation of tests to detect all single and multiple faults of the stuckline type in FET modules realizing complex functions. These networks are treated in a uniform manner, and a uniform notation is adopted for the tests required for diagnosis. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE