Computer Programs for the Analysis of the Broadening of X-Ray Powder Patterns.
NAVAL RESEARCH LAB WASHINGTON D C
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The report discusses in detail computer programs that have been written to analyze the broadening of x-ray diffraction peaks of hexagonal close-packed metals. The programs allow for the correction of the overlap of the long tails of the diffraction peak, and then correct for polarization and geometric factors, atomic scattering factors, and the K alpha doublet. Fourier coefficients are calculated using Filons method of evaluating trigonometric integrals. The Stokes corrected Fourier coefficients are separated into particle size and distortion coefficients using the Warren-Averbach technique modified for hexagonal close-packed metals. Domain sizes are obtained from fault-unaffected peaks, whereas stacking fault probabilities are obtained from fault-affected peaks. Author
- Computer Programming and Software