Study of Noise in Space-Charge-Limited Solid-State Devices.
Final rept. 23 Oct 64-15 Jun 70,
MINNESOTA UNIV MINNEAPOLIS INST OF TECH
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The report presents the results of a study of the high-frequency noise in space-charge-limited solid-state devices, and the measurements of the static characteristic and of the admittance of the device were used to help in the interpretation of the noise data. Author
- Electrical and Electronic Equipment