Accession Number:

AD0712759

Title:

FINDING A SINGLE DEFECTIVE IN BINOMIAL GROUP-TESTING.

Descriptive Note:

Technical rept.,

Corporate Author:

STANFORD UNIV CALIF DEPT OF STATISTICS

Personal Author(s):

Report Date:

1970-08-01

Pagination or Media Count:

29.0

Abstract:

The problem of finding a single defective item from an infinite binomial population is considered when the group-testing is possible, i.e., when one can test any number of units x simultaneously and find if all x are good or if at least 1 of the x defective is present. An optimal procedure is obtained in the sense that it minimizes the expected number of tests required to find one defective. Upper and lower bounds are derived using information theory. The relation of the procedure to the Huffman algorithm and the corresponding cost is studied. Author

Subject Categories:

  • Statistics and Probability
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE