Accession Number:

AD0706826

Title:

NEW INFRARED DETECTOR USING MICROWAVE TECHNIQUES.

Descriptive Note:

Technical rept.,

Corporate Author:

ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Personal Author(s):

Report Date:

1970-06-01

Pagination or Media Count:

21.0

Abstract:

A device is described whereby reflections from a semiconductor block placed in a waveguide are used to measure the photon flux incident on the semiconductor. A germanium sample with associated circuitry acts as a tuned cavity whereby in the null condition complete absorption occurs. As light changes the semiconductor conductivity, changes in reflected power provide a sensitive indicator. Computer calculations have been worked out in an exact analysis and the results are checked with experiments. As a photo detector, this device may be competitive with state-of-the art components. If used as a research tool to study semiconductor properties the scheme has a great deal of sensitivity and flexibility. Author

Subject Categories:

  • Infrared Detection and Detectors

Distribution Statement:

APPROVED FOR PUBLIC RELEASE