Accession Number:
AD0706826
Title:
NEW INFRARED DETECTOR USING MICROWAVE TECHNIQUES.
Descriptive Note:
Technical rept.,
Corporate Author:
ARMY ELECTRONICS COMMAND FORT MONMOUTH N J
Personal Author(s):
Report Date:
1970-06-01
Pagination or Media Count:
21.0
Abstract:
A device is described whereby reflections from a semiconductor block placed in a waveguide are used to measure the photon flux incident on the semiconductor. A germanium sample with associated circuitry acts as a tuned cavity whereby in the null condition complete absorption occurs. As light changes the semiconductor conductivity, changes in reflected power provide a sensitive indicator. Computer calculations have been worked out in an exact analysis and the results are checked with experiments. As a photo detector, this device may be competitive with state-of-the art components. If used as a research tool to study semiconductor properties the scheme has a great deal of sensitivity and flexibility. Author
Descriptors:
Subject Categories:
- Infrared Detection and Detectors