ELECTRICAL NOISE IN GaAs DIODE LASERS.
Final rept. Oct 68-Jan 69,
NAVAL RESEARCH LAB WASHINGTON D C
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Measurements were made of the current fluctuations at 30 MHz generated in a GaAs diode during luminescent and lasing operation. It was found that thermal noise predominates over other effects. Calculations indicate that this dominance is due to the small junction resistances which occur at helium temperatures. In addition, the line loss in the transmission system was found to limit the measurement system sensitivity. Author
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