Accession Number:

AD0697127

Title:

COMPUTER-AIDED TECHNIQUE FOR THE ACCURATE DETERMINATION OF THE SEMICONDUCTOR IMPURITY DOPING PROFILE.

Descriptive Note:

Research and development technical rept.,

Corporate Author:

ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Report Date:

1969-10-01

Pagination or Media Count:

20.0

Abstract:

The basic equations for the determination of semiconductor net impurity doping profiles are derived. A computer technique is introduced which aids the accurate solution of the basic equations. The described method is mathematically rigorous and represents a vast improvement over previously used techniques. Author

Subject Categories:

  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE