Accession Number:

AD0692763

Title:

IONIZATION CURVES FOR SECONDARY IONS IN MASS SPECTROMETER ION SOURCES,

Descriptive Note:

Corporate Author:

AIR FORCE CAMBRIDGE RESEARCH LABS L G HANSCOM FIELD MASS

Personal Author(s):

Report Date:

1969-06-01

Pagination or Media Count:

28.0

Abstract:

An automatic version of the R.P.D. Retarding Potential Difference method was developed for obtaining digital ionization curves of secondary ions by using counting techniques and a multi-channel analyzer. The application of an indirectly heated sintered Nickel cathode yielded ca. 40 percent of the total electron current within an energy range of 0.1 eV. The R.P.D. ion source in connection with the automation circuit and a conventional mass spectrometer were used to investigate the formation of KrD ions in Kr-D2 mixtures. It is shown that besides the well known reaction Kr D2 yields KrD D the complementary reaction D2 Kr yields KrD D contributes considerably to the KrD yield. A rather small contribution of the neutral reaction Kr D2 yields KrD D e-, found earlier by Hotop, could be confirmed. Strong evidence was found for the existence of a reaction path D2 Kr yields KrD D e- by longlived exited states of D2 above the first ionization limit of D2. Author

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE