FAILURE MECHANISMS IN PLASTIC ENCAPSULATED MICROCIRCUITS.
ROME AIR DEVELOPMENT CENTER GRIFFISS AFB N Y
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This paper deals with the question of military acceptance of microcircuits encapsulated in plastic materials. A discussion of military applications and requirements and their relation to device qualification testing and screening is given. It is pointed out that qualification tests are based neither upon absolute minimum standards nor validly derived acceleration factors, but on experience with similar devices, and knowledge of the expected capabilities of good devices. Epoxy, phenolic, and silicone encapsulated microcircuits have been subjected to a variety of high stress tests and four basic types of failures observed external surface conduction, internal silicon chip surface effects, aluminum metallization corrosion, and bond breakage due to thermal mismatch. Author
- Electrical and Electronic Equipment