Accession Number:

AD0684309

Title:

THIN-FILM ELECTRIC INITIATOR: IV. MECHANISM OF LOW-POWER EXPLOSION OF THIN-FILM RESISTORS,

Descriptive Note:

Corporate Author:

HARRY DIAMOND LABS WASHINGTON D C

Personal Author(s):

Report Date:

1968-12-01

Pagination or Media Count:

22.0

Abstract:

The burnout explosion mechanism for small, thin-film bridges deposited on various substrates was investigated in conjunction with the development of a miniature electric detonator. Film bridges on fused silica, barium aluminum borosilicate glass and polyimide film were exploded by the discharge current from a capacitor and also by current from a d-c source. Photomicrographs were taken of bridge resistors before and after they were burned out by capacitor discharge, and photomicrographs were taken of other bridge resistors before and during various stages of the burnout caused by the current furnished by the d-c source. It was concluded that the bridges burned out due to mechanical stresses caused by the different rates of thermal expansion between the bridge and substrate and the constraint of the electrodes. Author

Subject Categories:

  • Ammunition and Explosives

Distribution Statement:

APPROVED FOR PUBLIC RELEASE