Accession Number:

AD0680196

Title:

TECHNIQUE FOR LOCATING AND MAPPING THE SURFACE DENSITY OF MICRON-SIZED ASPERITIES USED AS COLD-CATHODE ELEMENTS.

Descriptive Note:

Technical rept.,

Corporate Author:

ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Personal Author(s):

Report Date:

1968-12-01

Pagination or Media Count:

12.0

Abstract:

In order to understand the effects of field emission from asperities, it is necessary to make direct field-emission-current measurements of individual asperities. A procedural and evaluation technique has been refined using a modified Muller microscope with a motion resolution of 0.006 micrometers 60 A, which accurately determines the location and density of micron-sized asperities. The surface of a film of molybdenum metal containing asperities is scanned by means of a fine probe tip of positive potential with respect to the sample. The equipment is described and the technique used for locating individual asperities in order to give a field-emission contour of the metal surface is reviewed. Results on experimental samples are discussed the criterion for the electric field strength of the asperities is discussed. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE