INFRARED EMISSION FROM FREE CARRIERS IN GERMANIUM.
PENNSYLVANIA STATE UNIV UNIVERSITY PARK DEPT OF PHYSICS
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Conley observed a radiation near 5 microns upon injecting excess carriers into thin germanium samples. The present investigation sought to identify the source of this radiation, and to study its properties. Preliminary measurements showed that the radiation was originating in the bulk and not at the surface of the samples. The emission intensity was found to increase with sample temperature which indicated that phonons were involved in the emission mechanism. This led to a study of free carriers since it was known that free electron absorption in germanium was a phonon-aided process. Author
- Solid State Physics