DEVELOPMENT OF AN INTERFERENCE ELECTRON MICROSCOPE.
Final technical rept. 1 Mar 67-30 Apr 68,
IMPERIAL COLL OF SCIENCE AND TECHNOLOGY LONDON (ENGLAND)
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This report covers a further years work in the development of an Interference Electron Microscope at Imperial College. The instrument is unlike others of its type which have been operated. The basic innovations are to produce the critical illumination conditions of conventional electron microscopy and thus give sufficient illumination intensity for high magnifications further to produce a broad fringe interference pattern such that the object being examined can be moved into regions where there is either pure amplitude or pure phase contrast. Two Moellenstedt electrostatic biprisms are necessary in the design and rotationally symmetric electromagnetic lenses are used throughout. Author