Accession Number:

AD0673299

Title:

STRUCTURAL CHARACTERIZATION OF THIN ALUMINUM OXIDE-HYDROXIDE LAYERS BY THE ALUMINUM AND OXYGEN X-RAY EMISSION BANDS

Descriptive Note:

Technical rept.

Corporate Author:

PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB

Personal Author(s):

Report Date:

1968-08-01

Pagination or Media Count:

12.0

Abstract:

A new technique is outlined for the characterization of thin films of crystalline and amorphous aluminum oxides, aluminum oxyhydroxides and aluminum hydroxides. Shifts in Al K-beta and OK-alpha X-ray emission lines of known examples of these compounds are presented and are used to identify unknown Al-O- OH compounds.

Subject Categories:

  • Properties of Metals and Alloys
  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE