STRUCTURAL CHARACTERIZATION OF THIN ALUMINUM OXIDE-HYDROXIDE LAYERS BY THE ALUMINUM AND OXYGEN X-RAY EMISSION BANDS
PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB
Pagination or Media Count:
A new technique is outlined for the characterization of thin films of crystalline and amorphous aluminum oxides, aluminum oxyhydroxides and aluminum hydroxides. Shifts in Al K-beta and OK-alpha X-ray emission lines of known examples of these compounds are presented and are used to identify unknown Al-O- OH compounds.
- Properties of Metals and Alloys
- Atomic and Molecular Physics and Spectroscopy