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OPTIMUM BINARY INTEGRATION.
Research and development rept. Feb 67-Feb 68,
NAVAL ELECTRONICS LAB CENTER FOR COMMAND CONTROL AND COMMUNICATIONS SAN DIEGO CALIF
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Some graphical results are presented as aids in selecting optimum thresholds for testing procedure known under the names binary integration, coincidence detection, binomial fixed-sample-size testing, double-threshold detection, K out of N detection, etc. Optimum thresholds are given for the Normal test of the mean and test of the variance, Rayleigh, Swerling Case 4, and Rice distributions. For the latter three distributions, curves of the required signal-to-noise ratio versus the number of pulses and of the miss probability versus the signal-to-noise ratio are given. All of the results assume statistically independent observations. Author
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