ANGULAR DISTRIBUTION OF RADIATION REFLECTED FROM CARBON DIOXIDE CRYODEPOSITS FORMED ON 77 Deg. K SURFACES
Final rept. Jun 1967-Jan 1968
ARNOLD ENGINEERING DEVELOPMENT CENTER ARNOLD AFB TN
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The angular distribution of light reflected from carbon dioxide cryodeposits formed at various rates on polished copper and black substrates has been measured for various cryodeposit thicknesses and angles of incidence. Cryodeposits were found to reflect light essentially diffusely at thicknesses greater than about 100 microns. The specular reflection from both polished copper and black substrates could be reduced by as much as two orders of magnitude by a 100-micron-thick cryodeposit. Bragg interference, backscattering, scattering interference, and shifts of the angular location of the specular component were all observed and illustrated that light reflection from cryodeposits is a very complex phenomenon.