Accession Number:

AD0662197

Title:

RELIABILITY SCREENING AND STEP-STRESS TESTING OF DIGITAL-TYPE MICROCIRCUITS.

Descriptive Note:

Research rept.,

Corporate Author:

NAVAL ELECTRONICS LAB CENTER FOR COMMAND CONTROL AND COMMUNICATIONS SAN DIEGO CALIF

Personal Author(s):

Report Date:

1967-09-01

Pagination or Media Count:

72.0

Abstract:

The effectiveness of thermal infrared mapping and nondestructive electrical tests for reliability screening was tested on 100 specimens of an industrial grade digital-type microcircuit. It was shown that more effective screening tests are needed, as a number of early failures were not predictable by the test methods employed. It was also shown that microcircuit containers may be opened for inspection and testing without degrading their reliability. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE