RELIABILITY SCREENING AND STEP-STRESS TESTING OF DIGITAL-TYPE MICROCIRCUITS.
NAVAL ELECTRONICS LAB CENTER FOR COMMAND CONTROL AND COMMUNICATIONS SAN DIEGO CALIF
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The effectiveness of thermal infrared mapping and nondestructive electrical tests for reliability screening was tested on 100 specimens of an industrial grade digital-type microcircuit. It was shown that more effective screening tests are needed, as a number of early failures were not predictable by the test methods employed. It was also shown that microcircuit containers may be opened for inspection and testing without degrading their reliability. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems