Accession Number:

AD0661905

Title:

INSTRUMENT FOR CONTACTLESS MEASURING OF PARAMETERS OF THIN SEMICONDUCTIVE FILMS,

Descriptive Note:

Corporate Author:

FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

Report Date:

1967-02-21

Pagination or Media Count:

10.0

Abstract:

A device for rapid measurement of parameters of semiconductor films is described. The apparatus removes the need for direct contact of electrodes upon test specimens and permits the study of parameter distribution along the film, as well as the investigation of kinetic photoelectric processes. A circuit diagram of the device is given. Special elements in its network include a 6NZP lamp and an ENO-1 oscillograph. The authors describe in detail the functions of the more important items in the network, paying particular attention to the use of electrodes on two types of measurement condensers. A discussion of the variation of network current with different semiconductor film sizes and types is given. Author

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE