NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.
Rept. no. 4, 1 Feb-31 Aug 67,
MINNESOTA UNIV MINNEAPOLIS ELECTRON TUBE RESEARCH LAB
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Noise measurements in transmission type secondary electron multipliers, image intensifier multipliers and continuous channel electron multipliers indicate that the noise can always be described as the product of the multiplied primary shot noise and a noise deterioration factor. The deterioration factor is comparable in all cases. The first two devices have a linear relative between output and input, but the channel multiplier is nonlinear. One must then distinguish between the true and apparent noise reduction factors. The latter can be quite small and it gives an inflated idea about the multiplier performance. Author
- Electrooptical and Optoelectronic Devices